Automatic detection of wafer appearance AOI
Rectifier diode chip automatically detects AOI
Bluetooth chip detects AOI automatically
MINILED金線嵌合自動AOI
IC appearance automatically detects AOI
Automatic detection of AOI by ultramicroline
大尺寸透明玻璃自動檢測AOI
中大尺寸蓋板玻璃檢測AOI
中大尺寸絲印玻璃自動AOI
中大尺寸白玻璃自動檢測AOI
Coated glass automatically detects AOI
Glass size measuring equipment
平板/NB/車載背光點(diǎn)亮A0I
The phone backlight is lit to automatically detect AOI
VR/AR背光點(diǎn)亮自動檢測AOI
Industrial backlight is lit to detect AOI automatically
Monitor /TV/ educational screen with large backlight automatically detects AOI
Automatic detection of AOI for both front and back appearance of backlight
OLED automatically detects AOI
CELL/Panel自動檢測AOI
FOG自動檢測AOI
LCD自動檢測AOI
?中大尺寸顯示器/TV/教育屏自動檢測AOI
Diffusion membrane automatically detects AOI
High permeability protective film automatically detects AOI
Polarizer automatically detects AOI
OCA automatically detects AOI
Automatic AOI detection for coated film materials
Automatic AOI detection for excipient film material
Camera cover plate appearance automatically detects AOI
Character appearance automatically detects AOI
Printed panel class automatically detects AOI
Monitor /TV/ educational screen internal inspection AOI
晶圓芯片外觀自動檢測AOI
說明:
1、AOI根據(jù)芯片的檢測結(jié)果自動生成MAP如圖
2、MAP讀取格式為wafermap,生成的MAP格式,包含有圖片,txt和xml
3、不同NG類別可輸出不同bin的要求 (map圖片顏色區(qū)別),同時可輸出檢驗(yàn)清單,包含不良分bin統(tǒng)計(jì)的數(shù)量
4、還可以根據(jù)客戶的MAP格式要求修訂MAP的內(nèi)容
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